Listar por autor "Portillo Cancho, Ane"
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Comparative Analysis of TSD and NTC-Based Temperature Measurement for Power Semiconductor Modules
Agirrezabala, Eneko; Portillo Cancho, Ane; Lajas Garcia, Miguel; Aizpuru, Iosu; Garrido, David (IEEE, 2025)Accurate temperature estimation is essential for ensuring the reliability and performance of power semiconductor devices. This paper presents various techniques used in the industry and focuses on a comparative analysis ... -
Reliability of power semiconductor modules: a state-of-the-art review
Agirrezabala Iradi, Eneko; Aizpuru Larrañaga, Iosu; Garrido Díez, David; Portillo Cancho, Ane (IEEE, 2025)





